IQE
IQE
Room-temperature reference point method
Wafer bowing
Wafer bowing
Non-destructive wafer bowing measurement system
TRPL
TRPL
Time-resolved photoluminescence
TDPL/TDEL
TDPL/TDEL
Temperature-dependent photo/electroluminescence
DOSA
DOSA
Designer for optoelectronic system analysis
Wafer level optical/electrical characterization
Wafer level optical/electrical characterization
Electroluminescence characterization of epitaxial wafer without full fabrication process
ER/PC
ER/PC
Electroreflectance and photocurrent spectroscopy
Defect analysis system
Defect analysis system
Steady-state photocapacitance