IQE

Room-temperature reference point method

Wafer bowing

Non-destructive wafer bowing measurement system


TRPL

Time-resolved photoluminescence

TDPL/TDEL

Temperature-dependent photo/electroluminescence

DOSA

Designer for optoelectronic system analysis

Wafer level optical/electrical characterization

Electroluminescence characterization of epitaxial wafer without full fabrication process

ER/PC

Electroreflectance and photocurrent spectroscopy

Defect analysis system

Steady-state photocapacitance