Glow Discharge Spectroscopy

Compositional depth profile in epitaxial wafer (atomic composition, doping concentration) 

Internal Quantum Efficiency (Originally developed by Hanyang Univ.)

Separate measurement of the IQE and the LEE just at room temp. without any parameter assumptions

Designer for Optoelectronic System Analysis (Original technique developed by Hanyang Univ.)

3-dimensional analysis software of current, voltage, and temperature distributions in a LED chip by electrical circuit modeling

Electroreflectance & Photocurrent Spectroscopy (Home-made system)

Measurements of Internal electric field, optical absorption spectra, and Stokes shift in QWs

Temperature Dependent Electro/Photo-luminescence Home-made system

IQE and carrier transport in LED

Time-Resolved Photo-luminescence, Original techniques developed by Hanyang Univ.

Radiative and nonradiative carrier lifetimes and IQE in QWs

Wafer bowing (Original techniques developed by Hanyang Univ.)

2-D measurement in epitaxial wafer from 2" to 6" bow/stress /strain/PL spectrum

Capacitance-Voltage (Home-made system)

LED Performance Characterization combined with

- C-V for bias, frequency, laser pumping
- IQE
- I-V
- Photo-luminescence
- Others

Current-Voltage (Home-made system)

Electrical performance analysis 

- Current path
- Carrier transport mechanism
- Defect related luminescence

Reliability analysis (Home-made system)

Reliability analysis

- Low/high current  stress
- High temperature stress
- Junction temp. measurement.
- Others

PHEMOS

Reveals invisible defects and failures.
Detects faint emission caused by anomalies to quickly and accurately determine the failure location.

Steady-State Photo-capacitance, Deep-Level Optical Spectroscopy (Home-made system)

Defect trap analysis in epitaxial layers

- Energy level
- Density
- Type
- Cross-section
- Others

Quick Check (Original techniques developed by Hanyang Univ.)

Evaluation of electroluminescence characteristics in LED epitaxial wafers. 

Chamber (Temperature-Dependent)

L-I-V analyze with Temperature-Dependent characteristic

PLATOM (with sorter photoluminescence mapper)

Measurements of characteristic in wafer level

- Dominant Wavelength
- Peak Wavelength
- FWHM
- Bowing check

Angle of Beam Spread

Measurement angular distribution of radiation.

Glow Discharge Spectroscopy

Spectroscopic technique used to observe vibrational, rotational, and other low-frequency modes in a system.
Analysis molecule of material using stokes scattering.