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3.   Dong-Guang Zheng, Dong-Soo Shin, and Jong-In Shim , "Measuring the surface temperature of light-emitting diodes by thermoreflectance" , Jpn. J. App. Phys., vol. 60, no. 5, pp. 052003-1 - 052003-7, May 5 , 2021
2.   Gyeong Won Lee, Yoonsuk Choi, Heejin Kim, Jongwoo Park, Jong-In Shim, and Dong-Soo Shin , "Analysis of transient degradation behaviors of organic light-emitting diodes under electrical stress" , Appl. Sci., vol. 11, no. 16, pp. 7627-1 - 7627-9, Aug. 19 , 2021
1.   Dong-Guang Zheng, Jong-In Shim, and Dong-Soo Shin , "Analysis of degradation mechanisms in GaN-based light-emitting diodes under reverse-bias stress: effects of defects and junction-temperature increase" , Jpn. J. App. Phys., vol. 60, no. 3, pp. 032006-1 - 032006-6, Mar. 8 , 2021

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