| System |   |
|
Technology |
System |
Experimental Results |
Contents |
|
GDS
(Glow Discharge Spectroscopy) |
 |
 |
Compositional depth profile in
epitaxial wafer
(atomic composition, doping
concentration) |
|
IQE
(Internal Quantum Efficiency)
Originally developed
by Hanyang Univ. |
 |
 |
Separate measurement of
the IQE and the LEE just
at room temp. without
any parameter assumptions |
|
DOSA
(Designer for Optoelectronic
System Analysis)
Original technique developed
by Hanyang Univ. |
 |
 |
3-dimensional analysis software
of current, voltage, and
temperature distributions
in a LED chip by electrical
circuit modeling |
|
DOSA
(Designer for Optoelectronic
System Analysis)
Original technique developed
by Hanyang Univ. |
 |
 |
Dynamic thermal flow
measurement system by
utilizing a periodic electric
pulse train |
|
ER/PC Spectroscopy
Electroreflectance &
Photocurrent
Home-made system |
 |
 |
Measurements of Internal
electric field, optical
absorption spectra, and
Stokes shift in QWs |
|
TDEL/TDPL
Temperature Dependent
Electro/Photo-luminescence
Home-made system |
 |
 |
IQE and carrier transport
in LED |
|
TRPL
(Time-Resolved Photo-luminescence)
Original techniques developed
by Hanyang Univ. |
 |
 |
Radiative and nonradiative
carrier lifetimes and IQE
in QWs |
|
Wafer bowing
Original techniques developed by Hanyang Univ. |
 |
 |
2-D measurement
in epitaxial wafer from
2" to 6" bow/stress
/strain/PL spectrum |
|
C-V
(Capacitance-Voltage)
Home-made system |
 |
 |
LED Performance
Characterization combined with
- C-V for bias, frequency,
laser pumping
- IQE
- I-V
- Photo-luminescence
- Others |
|
I-V
(Current-Voltage)
Home-made system
|
 |
 |
Electrical performance analysis
- Current path
- Carrier transport mechanism
- Defect related luminescence |
|
Reliability analysis
Home-made system |
 |
 |
Reliability analysis
- Low/high current stress
- High temperature stress
- Junction temp. measurement.
- Others |
PHEMOS |  |  | Reveals invisible defects and failures. Detects faint emission caused by anomalies to quickly and accurately determine the failure location. |
|
SSPC
(Steady-State Photo-capacitance)
DLOS
(Deep-Level Optical Spectroscopy)
Home-made system |
 |
 |
Defect trap analysis
in epitaxial layers
- Energy level
- Density
- Type
- Cross-section
- Others |
Quick Check Original techniques developed by Hanyang Univ. |  |  | Evaluation of electroluminescence characteristics in LED epitaxial wafers. |
Chamber (Temperature-Dependent) |  |  | L-I-V analyze with Temperature-Dependent characteristic |
PLATOM (with sorter photoluminescence mapper) |  |  | Measurements of characteristic in wafer level - Dominant Wavelength - Peak Wavelength - FWHM - Bowing check |
Angle of Beam Spread |  |  | Measurement angular distribution of radiation. |
Raman |  |  | Spectroscopic technique used to observe vibrational, rotational, and other low-frequency modes in a system. Analysis molecule of material using stokes scattering. |